Siemens/Bruker D5000 XRD (X-ray Diffractometer) is now equipped with Gobel mirror enhancing the intensity and signal qualitu for us to analyze crystal structure and basic material parameters. In addition, in situ measurements can be demonstrated with its special heating stage.
X-ray source
CuKa source with single gobel mirror
Electron accelerating voltage range 20-55KV

Specimen stage
Rotational speed 15 30 60 120 rpm
Scanning velocity Max 5400o/min

Angle positioning 0,380/step

Analytical capability
Powder and thin film x-ray diffraction analysis
In Situu heating stage measurement