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Gatan PIPSII ion mill

Our Precise Ion Polishing System (PIPS) II is the latest version of ion milling system and a powerful tool for TEM specimen preparation. It uses a focused Ar ion beam to precisely mill TEM samples until a small hole is created in their thinned area. The voltage can be tuned between 100 V-8kV. The low voltage ion beam is used for the final stage to get rid of the surface damage caused by high voltage ion beam. TEM samples prepared by FIB can be cleaned by PIPSII as well. It is in the room 1121 Engineering Hall.