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Rigaku SmartLab X-ray Diffractometer

The Rigaku SmartLab is the state of the art in highly automated, fully modular, multipurpose X-ray diffractometers. This fully-loaded system features a 2.2 kW Cu tube and a high-resolution closed loop theta-theta vertical goniometer with a horizontal sample stage and a 6-position automatic sample changer. Rigaku's patented cross beam optics (CBO) allows rapid switching between parafocusing geometry for powder samples and parallel beam geometry for thin films and epilayers. The system incorporates SAXS optics for measuring structures with d-spacings up to 100 nm in either transmission (spinning capillary) or reflection (GISAXS) mode. A CBO-f polycapillary optics attachment is available to create a high-intensity point focus of 100 microns for micro-diffraction experiments. An in-plane diffraction attachment provides an additional detector scanning axis orthogonal to the theta/2-theta diffraction plane to allow measurement of lattice planes perpendicular to the sample surface (e.g., in-plane reciprocal space maps and full pole figures). Four incident beam monochromators {Ge(220) 2-bounce, Ge(220) 4-bounce, Ge(400) 2-bounce, Ge(440) 4-bounce} and two analyzer monochromators {Ge(220) 2-bounce and Ge(400) 2-bounce} enable medium and high resolution X-ray diffraction and reflectivity measurements of highly perfect crystals, epilayers, and multilayer samples with up to 5 arc second resolution. The system's Anton Paar DHS domed hot stage can be used for in situ measurements of samples in vacuum, air, or inert gas up to 1100°C. A second furnace stage offers in situ capability in vacuum, air, or inert gas up to 1500°C. The SmartLab is outfitted with three detectors for maximum versatility and speed: a point scintillator, a 1D D/teX Ultra high speed silicon strip detector, and a 2D CMOS Pilatus area detector (module size: 83.8 × 33.5 mm²). The most novel feature of Smartlab is the control software, called "Smartlab Guidance." It can provide an intelligent interface to guide users to select optimal hardware configurations and provides fully automated optics alignment, sample alignment, slit and scan condition settings, and measurements, which helps to minimize the time-to-results for all users. Measurement packages are available for nearly any conceivable X-ray scattering experiment, including the following:

  • Powder materials: phase ID, crystalline strain and size, crystallinity, structural analysis and refinement, stress measurement, temperature-dependent in situ phase evolution to 1500°C in controlled or ambient environment
  • Thin films: Structural analysis, texture analysis, inplane diffraction, crystal quality analysis (rocking curve and reciprocal space mapping), high resolution X-ray diffraction and reflectivity (HRXRD and HRXRR), GIXRD depth profiles, 2D stress and PF measurement, temperature-dependent in situ phase evolution up to 1100°C in controlled or ambient environment
  • Small-angle X-ray scattering (SAXS): particle/pore size distribution and correlation length analysis, nanoscale structural analysis containing atoms and molecular, structure and dynamics of biological macromolecules, liquids
  • Microdiffraction: XRD with the ability to precisely and accurately position a small X-ray beam (down to Ø100 µm size) on a small sample,100x100 mm² diffraction function mapping (DFM).