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JEM-ARM300F Grand ARM TEM

JEOL Grand ARM300CF TEM/STEM

The JEOL JEM-ARM300CF S/STEM, equipped with double correctors and cold field emission gun, dual large angle EDS detectors, and Gatan GIF Quantum, and K2 direct detection camera, and OneView camera,  exceeds atomic resolution boundaries for any commercially available S/TEMs.  Designed to meet the most advanced materials development requirements for atom-by-atom characterization and chemical mapping, the Grand ARM offers the highest level of performance.

Electron Source & Operating HT: Cold field emission gun 60kV~300kV

Resolution:
TEM Point-to-point: 0.1nm
STEM HAADF: 0.082nm ( 82pm)

Operation mode:
TEM (including nano-beam and convergent beam modes)
STEM (ADF, BF)

EDS: Dual silicon drift detectors

CCD camera:
Gatan OneView Camera: fast 25fps with full 4K x 4K resolution
Gatan K2 Derect Detection Camera with super high DQE